Home / Research Library / Towards Total Recall in Industrial Anomaly Detecti...
🤖 Artificial Intelligence OpenAlex

Towards Total Recall in Industrial Anomaly Detection

📅 June 1, 2022 👤 Karsten Roth, Latha Pemula, Joaquin Zepeda et al. 📖 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) 📊 1,348 citations

🤖 Plain-English Summary

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.

🔑 Key Findings

  • A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only.
  • While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically.
  • The best peforming approaches combine embeddings from ImageNet models with an outlier detection model.

💡 Why This Matters

This research advances how AI systems learn, reason, and solve problems — with direct implications for automation and scientific discovery.

Read the full paper
Access the original peer-reviewed research via OpenAlex.

View on DOI ↗

📋 Article Details

Category 🤖 Artificial Intelligence
Published Jun 01, 2022
Journal 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Authors Karsten Roth, Latha Pemula, Joaquin Zepeda, Bernhard Schölkopf, Thomas Brox
DOI 10.1109/cvpr52688.2022.01392
Citations 1,348
Source OpenAlex

More 🤖 Artificial Intelligence Research